CSS Mixed Signal ASIC Solutions

From Concept through Production,
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ASIC Glossary of Terms



A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

Rails
Extruded Aluminum or Plastic Tubes for Component / Device Handling.


RAM:
Random Access Memory-A storage device in which the ability to access a randomly selected bit of stored data is independent of either the timing of the most recent access of that bit or the location of the most recently addressed bit.


Reject number:
For a sample test, the number of failed devices which will cause lot rejection. This will normally be one higher than the accept number.


Reliability:
The anticipated lifetime of a device, how long it can be expected to "survive" in the user's system. This is normally defined as a failure rate (percent per 1000 hours) or as an MTBF (Mean Time Between Failures, expressed in hours).


Reticle
A photomask used in the fabrication of a wafer


RF:
Radio Frequency, The range of electromagnetic frequencies above the audio range and below infrared light (from 10 kHz to 300 GHz.


ROM:
Read Only Memory-A semiconductor device for storing data in permanent, nonerasable form, usually accomplished through the configuration of the metal mask pattern during wafer fabrication.