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ASIC Glossary of Terms



A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

Operating life:
Burn-in (that is, exposure to high temperature with electrical bias applied) performed for extended duration . Normally a sample test.


Oxide isolation:
The separation of circuit elements on a semiconductor device through the construction of a barrier oxide between the elements (not to be confused with dielectric isolation, in which the isolation passes completely under the circuit element.